Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.11790/1648
Title: A novel approach for evaluation of material interfaces in electronics
Other Titles: 2016 IEEE Aerospace Conference, AERO 2016, Big Sky, United States, 5 March 2016 through 12 March 2016
Authors: Czerny, Bernhard 
Khatibi, Golta 
Lassnig, Alice 
Lederer, Martin 
Nicolics, Johann 
Magnien, Julien 
Suhir, Ephraim 
Issue Date: 5-Mar-2016
Source: IEEE Aerospace Conference Proceedings, 27(June 2016), pp. 1-11
Journal: IEEE Aerospace Conference Proceedings 
Series/Report no.: IEEE Aerospace Conference Proceedings;7500758
Abstract: The rapid technological advancements and market demands in electronic sector requires application of highly accelerated, still practice relevant reliability assessment methods. At present, accelerated power and temperature cycling tests count as the state of the art for qualification of the devices. However due to physical characteristics of the devices, there are limitations to accelerated thermal and power cycling tests. Further acceleration by exceeding a critical temperature or time reduction may result in occurrence of failure mechanisms other than those encountered in real application or suppressing these failures. An alternative approach for further acceleration of the testing procedures is based on the application of isothermal mechanical fatigue testing at high frequencies (AMT). The principle idea of this approach is replacement of thermally induced strains by means of equivalent mechanical strains. Based on a physics of failure approach, the relevant failure modes in the material interfaces are induced enabling detection of weak sites of the devices in a very short duration of time. In addition of time saving factor a further advantage of mechanical fatigue testing is the possibility of decoupling of thermal, mechanical and environmental stress factors for a more effective investigation and diagnosis. This paper presents an overview of our recent reliability studies on different types of electronic components by using the proposed methodology with the aim to give an insights into the advantages and some restrictions of AMT for qualification of electronic devices.
URI: http://hdl.handle.net/20.500.11790/1648
ISBN: 978-146737676-1
ISSN: 1095323X
DOI: 10.1109/AERO.2016.7500758
10.1016/j.microrel.2016.07.068
Appears in Collections:Energie-Umweltmanagement

SFX Query Show full item record

SCOPUSTM   
Citations

3
checked on Nov 28, 2021

Page view(s)

9
Last Week
0
Last month
0
checked on Dec 2, 2021

Google ScholarTM

Check

Altmetric

Altmetric
Dimensions


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.