DSpace CRIS
DSpace-CRIS consists of a data model describing objects of interest to Research and Development and a set of tools to manage the data. Standard DSpace is used to deal with publications and data sets, whereas DSpace-CRIS involves other CRIS entities: Researcher Pages, Projects, Organization Units and Second Level Dynamic Objects (single entities specialized by a profile, such as Journal, Prize, Event etc; because any profile can define its own set of properties and nested objects)
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Journals Microelectronics Reliability
Name
Microelectronics Reliability
Peer-Review
Subject Classifications
Ingenieurwissenschaften und Maschinenbau
ZDB
SJR
Journal's Article
(All)
Date issued
Fulltext
Results 1-4 of 4 (Search time: 0.001 seconds).
| Issue Date | Title | Author(s) | |
|---|---|---|---|
| 1 | 2000 | High resolution thermal simulation of electronic components | Hanreich, Gernot ; Nicolics, Johann ; Musiejovsky, Laszlo |
| 2 | 1-Mar-2016 | Interface reliability and lifetime prediction of heavy aluminum wire bonds | Czerny, Bernhard ; Khatibi, Golta |
| 3 | 2017 | Reliability of Cu wire bonds in microelectronic packages | Czerny, Bernhard ; Mazloum-Nejadari, Ali ; Khatibi, Golta ; Lederer, Martin ; Nicolis, Johann ; Weiss, Laurens |
| 4 | Sep-2017 | Wire bond degradation under thermo- and pure mechanical loading | Czerny, Bernhard ; Pedersen, Kristian Bonderup ; Nielsen, Dennis A. ; Khatibi, Golta ; Iannuzzo, Francesco ; Popok, Vladimir N. ; Pedersen, Kjeld |