Journals Microelectronics Reliability

Name
Microelectronics Reliability
Peer-Review
Subject Classifications
Ingenieurwissenschaften und Maschinenbau
ISSN
0026-2714
ZDB
Journal's Article
(All)
Date issued
Fulltext
Results 1-1 of 1 (Search time: 0.0 seconds).
Issue Date | Title | Author(s) | |
---|---|---|---|
1 | 2000 | High resolution thermal simulation of electronic components | Hanreich, Gernot ; Nicolics, Johann ; Musiejovsky, Laszlo |