Journals Microelectronics Reliability

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Name
Microelectronics Reliability
 
Peer-Review
 
 
Subject Classifications
Ingenieurwissenschaften und Maschinenbau
 
ISSN
0026-2714
 
ZDB
 
SJR
SCImago Journal & Country Rank
 

Journal's Article
(All)

Results 1-1 of 1 (Search time: 0.002 seconds).

Issue DateTitleAuthor(s)
12000High resolution thermal simulation of electronic componentsHanreich, Gernot ; Nicolics, Johann ; Musiejovsky, Laszlo