DSpace CRIS
DSpace-CRIS consists of a data model describing objects of interest to Research and Development and a set of tools to manage the data. Standard DSpace is used to deal with publications and data sets, whereas DSpace-CRIS involves other CRIS entities: Researcher Pages, Projects, Organization Units and Second Level Dynamic Objects (single entities specialized by a profile, such as Journal, Prize, Event etc; because any profile can define its own set of properties and nested objects)
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Journals Microelectronics Reliability
Name
Microelectronics Reliability
Peer-Review
Subject Classifications
Ingenieurwissenschaften und Maschinenbau
ISSN
0026-2714
ZDB
SJR
Journal's Article
(All)
Date issued
Fulltext
Results 1-1 of 1 (Search time: 0.002 seconds).
| Issue Date | Title | Author(s) | |
|---|---|---|---|
| 1 | 2000 | High resolution thermal simulation of electronic components | Hanreich, Gernot ; Nicolics, Johann ; Musiejovsky, Laszlo |