Browsing by Author Nicolics, Johann

Showing results 1 to 12 of 12
Issue DateTitleAuthor(s)
5-Mar-2016A novel approach for evaluation of material interfaces in electronicsCzerny, Bernhard ; Khatibi, Golta ; Lassnig, Alice ; Lederer, Martin ; Nicolics, Johann ; Magnien, Julien ; Suhir, Ephraim 
17-Sep-2012Electro-thermal analysis of in situ vibration measurements on IGBT modules under operation conditionsCzerny, Bernhard ; Nagl, Bernhard ; Lederer, Martin ; Khatibi, Golta ; Thoben, Markus ; Nicolics, Johann 
26-May-2013Experimental investigation of transient electrical, thermal and mechanical behavior of IGBT inverter modules during operationCzerny, Bernhard ; Thoben, Markus ; Khatibi, Golta ; Lederer, Martin ; Nagl, Bernhard ; Nicolics, Johann 
2000High resolution thermal simulation of electronic componentsHanreich, Gernot ; Nicolics, Johann ; Musiejovsky, Laszlo 
18-Sep-2018Investigation on the Lifetime of Copper Wire Bonds in Electronic Packages under Thermal and Mechanical Cyclic LoadingCzerny, Bernhard ; Lederer, Martin ; Mazloum-Nejadari, Ali ; Khatibi, Golta ; Weiss, Laurens ; Nicolics, Johann 
18-Apr-2016Reliability analysis of Cu wire bonds in microelectronic packagesCzerny, Bernhard ; Mazloum-Nejadari, Ali ; Khatibi, Golta ; Lederer, Martin ; Nicolics, Johann ; Weiss, Laurens 
5-Feb-2004Simulationsunterstützte thermische Analyse einer Galliumarsenid-Feldeffekt-LeistungstransistorbaugruppeHanreich, Gernot ; Mündlein, Martin ; Nicolics, Johann ; Mayer, Markus 
May-2007Thermal Analysis of Multilayer Printed Circuit Boards with Embedded Carbon Black-Polymer ResistorsNicolics, Johann ; Mündlein, Martin ; Hanreich, Gernot ; Zluc, A. ; Stahr, H. ; Franz, M 
2004Thermal Investigation of GaAs Microwave Power TransistorsHanreich, Gernot ; Mayer, Markus ; Mündlein, Martin ; Nicolics, Johann 
2005Thermal Simulation of and Characterization of AlGaN/GaN/Si High Electron Mobility TransistorsHanreich, Gernot ; Bychikhin, Sergey ; Pogany, Dionyz ; Marso, Michel ; Kordos, Peter ; Nicolics, Johann 
16-May-2018Thermomechanical Reliability Investigation of Insulated Gate Bipolar Transistor ModuleCzerny, Bernhard ; Khatibi, Golta ; Liedtke, Magnus ; Nicolics, Johann 
3-Dec-2014Towards adequate qualification testing of electronic products: Review and extensionCzerny, Bernhard ; Khatibi, Golta ; Lederer, Martin ; Magnien, Julien ; Suhir, Ephraim ; Nicolics, Johann